Keyword : layout-aware


Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress
Kenta YAMADA Takashi SATO Shuhei AMAKAWA Noriaki NAKAYAMA Kazuya MASU Shigetaka KUMASHIRO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2008/07/01
Vol. E91-C  No. 7 ; pp. 1142-1150
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
STIstressmodelingSPICElayout-aware
 Summary | Full Text:PDF