| Keyword : junction
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Junction Depth Dependence of the Gate Induced Drain Leakage in Shallow Junction Source/Drain-Extension Nano-CMOS Seung-Hyun SONG Jae-Chul KIM Sung-Woo JUNG Yoon-Ha JEONG | Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2008/05/01
Vol. E91-C
No. 5 ;
pp. 761-766
Type of Manuscript:
Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Keyword: GIDL, junction, halo, nanoscale CMOS, | | Summary | Full Text:PDF(646.9KB) | |
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