Keyword : intra-gate variability

Statistical Gate-Delay Modeling with Intra-Gate Variability
Kenichi OKADA Kento YAMAOKA Hidetoshi ONODERA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2003/12/01
Vol. E86-A  No. 12 ; pp. 2914-2922
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Parasitics and Noise
intra-chip variabilitystatistical timing analysisintra-gate variabilitymanufacturing fluctuation
 Summary | Full Text:PDF(677.1KB)