Keyword : intra-die variations


Intra-Die Spatial Correlation Extraction with Maximum Likelihood Estimation Method for Multiple Test Chips
Qiang FU Wai-Shing LUK Jun TAO Xuan ZENG Wei CAI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/12/01
Vol. E92-A  No. 12 ; pp. 3007-3015
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Device and Circuit Modeling and Analysis
Keyword: 
intra-die variationsspatial correlationmaximum likelihood estimation
 Summary | Full Text:PDF

Characterizing Intra-Die Spatial Correlation Using Spectral Density Fitting Method
Qiang FU Wai-Shing LUK Jun TAO Changhao YAN Xuan ZENG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/07/01
Vol. E92-A  No. 7 ; pp. 1652-1659
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
intra-die variationsspatial correlationcorrelation functionspectral density
 Summary | Full Text:PDF