Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C
No. 5 ;
pp. 674-679
Type of Manuscript:
Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category:
Keyword:
Ge-channel, high-k dielectrics, interfacial control layer, X-ray photoelectron spectroscopy, energy band alignment, |
