Keyword : inspection


High Tc SQUID Detector for Magnetic Metallic Particles in Products
Saburo TANAKA Tomonori AKAI Yoshimi HATSUKADE Shuichi SUZUKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/03/01
Vol. E92-C  No. 3 ; pp. 323-326
Type of Manuscript:  INVITED PAPER (Special Section on Recent Progress in Superconducting Analog Devices and Their Applications)
Category: 
Keyword: 
SQUIDsuperconductordetectioninspectionmetallic contaminant
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A Development of the TFT-LCD Image Defect Inspection Method Based on Human Visual System
Jong-Hwan OH Byoung-Ju YUN Se-Yun KIM Kil-Houm PARK 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/06/01
Vol. E91-A  No. 6 ; pp. 1400-1407
Type of Manuscript:  Special Section PAPER (Special Section on Image Media Quality)
Category: 
Keyword: 
TFT-LCD (thin film transistor-liquid crystal display)inspectionpolynomial regressionhuman visual systemcontrast sensitivity function
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Defect Detection of TFT-LCD Image Using Adapted Contrast Sensitivity Function and Wavelet Transform
Jong-Hwan OH Woo-Seob KIM Chan-Ho HAN Kil-Houm PARK 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/11/01
Vol. E90-C  No. 11 ; pp. 2131-2135
Type of Manuscript:  Special Section LETTER (Special Section on Electronic Displays)
Category: 
Keyword: 
TFT-LCDinspectionwavelet transformhuman visual systemcontrast sensitivity function
 Summary | Full Text:PDF

High-Tc SQUID Metal Detection System for Food and Pharmaceutical Contaminants
Saburo TANAKA Shozen KUDO Yoshimi HATSUKADE Tatsuoki NAGAISHI Kazuaki NISHI Hajime OTA Shuichi SUZUKI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/02/01
Vol. E88-C  No. 2 ; pp. 175-179
Type of Manuscript:  INVITED PAPER (Special Section on Superconducting Electronic Devices and Their Applications)
Category: 
Keyword: 
SQUIDsuperconductorfood safetydetectioninspectioncontaminant
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Laser-SQUID Microscopy as a Novel Tool for Inspection, Monitoring and Analysis of LSI-Chip-Defects: Nondestructive and Non-electrical-contact Technique
Kiyoshi NIKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/03/01
Vol. E85-C  No. 3 ; pp. 746-751
Type of Manuscript:  INVITED PAPER (Special Issue on Superconductive Electronics)
Category: Instruments and Coolers
Keyword: 
high Tc DC-SQUIDoptical beam induced currentphoto currenthigh spatial resolutionelectrical defectsinspectionfailure analysis
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