Keyword : in-field repair strategy


Reliability-Enhanced ECC-Based Memory Architecture Using In-Field Self-Repair
Gian MAYUGA Yuta YAMATO Tomokazu YONEDA Yasuo SATO Michiko INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/10/01
Vol. E99-D  No. 10 ; pp. 2591-2599
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
memory repairmemory reliabilityin-field test and repairECCin-field repair strategyremapping
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