IEICE Trans

Keyword : hot-carrier

Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs Jae-Hyung JANG Hyuk-Min KWON Ho-Young KWAK Sung-Kyu KWON Seon-Man HWANG Jong-Kwan SHIN Seung-Yong SUNG Yi-Sun CHUNG Da-Soon LEE Hi-Deok LEE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2013/05/01 Vol. E96-C No. 5 ; pp. 624-629 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: fluorine, flicker noise, 1/f noise, reliability, hot-carrier, NBTI, MOSFET,
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Efficient Application of Hot-Carrier Reliability Simulation to Delay Library Screening for Reliability of Logic Designs Hisako SATO Mariko OHTSUKA Kazuya MAKABE Yuichi KONDO Kazumasa YANAGISAWA Peter M. LEE
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/05/01 Vol. E86-C No. 5 ; pp. 842-849 Type of Manuscript: PAPER Category: Electronic Circuits Keyword: hot-carrier, circuit reliability, simulation, delay library, logic design,
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A Study of Electrical Characteristics Improvements in Sub-0.1 µm Gate Length MOSFETs by Low Temperature Operation Morikazu TSUNO Shin YOKOYAMA Kentaro SHIBAHARA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1998/12/25 Vol. E81-C No. 12 ; pp. 1913-1917 Type of Manuscript: PAPER Category: Semiconductor Materials and Devices Keyword: MOSFET, low temperature, velocity overshoot, Sb, nonsteady-stationary effect, impact ionization, hot-carrier,
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Test Structure and Experimental Analysis of Emitter-Base Reverse Voltage Stress Degradation in Self-Aligned Bipolar Transistors Hiromi SHIMAMOTO Masamichi TANABE Takahiro ONAI Katsuyoshi WASHIO Tohru NAKAMURA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/02/25 Vol. E79-C No. 2 ; pp. 211-218 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Reliability Analysis Keyword: self-aligned bipolar transistor, hot-carrier, emitter-base reverse voltage stress,
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Water Desorption Control of Interlayer Dielectrics to Reduce MOSFET Hot Carrier Degradation Kimiaki SHIMOKAWA Takashi USAMI Masaki YOSHIMARU
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/03/25 Vol. E77-C No. 3 ; pp. 473-479 Type of Manuscript: Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies) Category: Process Technology Keyword: water desorption, oxide, PECVD, pore, hot-carrier, interlayer,
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A Two-Dimensional Analysis of Hot-Carrier Photoemission from LOCOS- and Trench-Isolated MOSFETs Takashi OHZONE Hideyuki IWATA Yukiharu URAOKA Shinji ODANAKA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/11/25 Vol. E76-C No. 11 ; pp. 1673-1682 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: CMOS, hot-carrier, photoemission, isolation,
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Hot-Carrier Reliability in Submicrometer Ultra-Thin SOI-MOSFET's Yasuo YAMAGUCHI Masahiro SHIMIZU Yasuo INOUE Tadashi NISHIMURA Katsuhiro TSUKAMOTO
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/12/25 Vol. E75-C No. 12 ; pp. 1465-1470 Type of Manuscript: Special Section PAPER (Special Issue on SOI (Si on Insulator) Devices) Category: Hot Carrier Keyword: thin SOI, hot-carrier, SIMOX, gate-overlapped LDD,
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Hot-Carrier-Induced Photon Emission in Thin SOI/MOSFETs Seiichiro KAWAMURA Takami MAKINO Kazuo SUKEGAWA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/12/25 Vol. E75-C No. 12 ; pp. 1471-1476 Type of Manuscript: Special Section PAPER (Special Issue on SOI (Si on Insulator) Devices) Category: Hot Carrier Keyword: hot-carrier, photon emission, thin SOI, carrier temperature,
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