Keyword : hot-carrier


Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs
Jae-Hyung JANG Hyuk-Min KWON Ho-Young KWAK Sung-Kyu KWON Seon-Man HWANG Jong-Kwan SHIN Seung-Yong SUNG Yi-Sun CHUNG Da-Soon LEE Hi-Deok LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2013/05/01
Vol. E96-C  No. 5 ; pp. 624-629
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
fluorineflicker noise1/f noisereliabilityhot-carrierNBTIMOSFET
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Efficient Application of Hot-Carrier Reliability Simulation to Delay Library Screening for Reliability of Logic Designs
Hisako SATO Mariko OHTSUKA Kazuya MAKABE Yuichi KONDO Kazumasa YANAGISAWA Peter M. LEE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/05/01
Vol. E86-C  No. 5 ; pp. 842-849
Type of Manuscript:  PAPER
Category: Electronic Circuits
Keyword: 
hot-carriercircuit reliabilitysimulationdelay librarylogic design
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A Study of Electrical Characteristics Improvements in Sub-0.1 µm Gate Length MOSFETs by Low Temperature Operation
Morikazu TSUNO Shin YOKOYAMA Kentaro SHIBAHARA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/12/25
Vol. E81-C  No. 12 ; pp. 1913-1917
Type of Manuscript:  PAPER
Category: Semiconductor Materials and Devices
Keyword: 
MOSFETlow temperaturevelocity overshootSbnonsteady-stationary effectimpact ionizationhot-carrier
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Test Structure and Experimental Analysis of Emitter-Base Reverse Voltage Stress Degradation in Self-Aligned Bipolar Transistors
Hiromi SHIMAMOTO Masamichi TANABE Takahiro ONAI Katsuyoshi WASHIO Tohru NAKAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/02/25
Vol. E79-C  No. 2 ; pp. 211-218
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: Reliability Analysis
Keyword: 
self-aligned bipolar transistorhot-carrieremitter-base reverse voltage stress
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Water Desorption Control of Interlayer Dielectrics to Reduce MOSFET Hot Carrier Degradation
Kimiaki SHIMOKAWA Takashi USAMI Masaki YOSHIMARU 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/25
Vol. E77-C  No. 3 ; pp. 473-479
Type of Manuscript:  Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Process Technology
Keyword: 
water desorptionoxidePECVDporehot-carrierinterlayer
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A Two-Dimensional Analysis of Hot-Carrier Photoemission from LOCOS- and Trench-Isolated MOSFETs
Takashi OHZONE Hideyuki IWATA Yukiharu URAOKA Shinji ODANAKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/11/25
Vol. E76-C  No. 11 ; pp. 1673-1682
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
CMOShot-carrierphotoemissionisolation
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Hot-Carrier Reliability in Submicrometer Ultra-Thin SOI-MOSFET's
Yasuo YAMAGUCHI Masahiro SHIMIZU Yasuo INOUE Tadashi NISHIMURA Katsuhiro TSUKAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/12/25
Vol. E75-C  No. 12 ; pp. 1465-1470
Type of Manuscript:  Special Section PAPER (Special Issue on SOI (Si on Insulator) Devices)
Category: Hot Carrier
Keyword: 
thin SOIhot-carrierSIMOXgate-overlapped LDD
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Hot-Carrier-Induced Photon Emission in Thin SOI/MOSFETs
Seiichiro KAWAMURA Takami MAKINO Kazuo SUKEGAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/12/25
Vol. E75-C  No. 12 ; pp. 1471-1476
Type of Manuscript:  Special Section PAPER (Special Issue on SOI (Si on Insulator) Devices)
Category: Hot Carrier
Keyword: 
hot-carrierphoton emissionthin SOIcarrier temperature
 Summary | Full Text:PDF