Keyword : hot-carrier degradation

New Low-Voltage Low-Latency Mixed-Voltage I/O Buffer
Joung-Yeal KIM Su-Jin PARK Yong-Ki KIM Sang-Keun HAN Young-Hyun JUN Chilgee LEE Tae Hee HAN Bai-Sun KONG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/05/01
Vol. E93-C  No. 5 ; pp. 709-711
Type of Manuscript:  LETTER
Category: Integrated Electronics
mixed-voltageI/O buffergate-oxide reliabilityleakage currenthot-carrier degradation
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Two-Dimensional Simulation of Electric Field and Carrier Concentration of Low-Temperature N-Channel Poly-Si LDD TFTs
Yukisato NOGAMI Toshifumi SATOH Hiroyuki TANGO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/05/01
Vol. E90-C  No. 5 ; pp. 983-987
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: Junction Formation and TFT Reliability
n-channel poly-Si LDD TFTdevice simulationelectric field distributioncarrier concentration distributionhot-carrier degradation
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Application of Circuit-Level Hot-Carrier Reliability Simulation to Memory Design
Peter M. LEE Tsuyoshi SEO Kiyoshi ISE Atsushi HIRAISHI Osamu NAGASHIMA Shoji YOSHIDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 595-601
Type of Manuscript:  PAPER
Category: Electronic Circuits
hot-carrier degradationreliabilitydevice lifetimecircuit simulationSRAMDRAM
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