Keyword : hot carrier


A Test Structure for Two-Dimensional Analysis of MOSFETs by Hot-Carrier-Induced Photoemission
Toshihiro MATSUDA Hiroaki TAKEUCHI Akira MURAMATSU Hideyuki IWATA Takashi OHZONE Kyoji YAMASHITA Norio KOIKE Ken-ichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5 ; pp. 811-816
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
MOSFETphotoemissionhot carriergate length
 Summary | Full Text:PDF

A Modeling Methodology and Body Effect Analysis for Hot-Carrier Reliability Simulation of Logic Circuits
Norio KOIKE Hirokazu YONEZAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/06/01
Vol. E85-C  No. 6 ; pp. 1356-1366
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
hot carriersecondary hot electronsimulation
 Summary | Full Text:PDF

A New Test Structure for Precise Location Measurement of Hot-Carrier-Induced Photoemission Peak in Subquarter-Micron MOSFETs
Toshihiro MATSUDA Mari FUNADA Takashi OHZONE Etsumasa KAMEDA Shinji ODANAKA Kyoji TAMASHITA Norio KOIKE Ken-ichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/05/01
Vol. E85-C  No. 5 ; pp. 1125-1133
Type of Manuscript:  Special Section PAPER (Special Issue on Microelectronic Test Structures)
Category: 
Keyword: 
test structureMOSFEThot carrierphotoemission
 Summary | Full Text:PDF

The Influence of Stud Bumping above the MOSFETs on Device Reliability
Nobuhiro SHIMOYAMA Katsuyuki MACHIDA Masakazu SHIMAYA Hideo AKIYA Hakaru KYURAGI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2000/05/25
Vol. E83-A  No. 5 ; pp. 851-856
Type of Manuscript:  Special Section PAPER (Special Section on Reliability Theory and Its Applications)
Category: 
Keyword: 
stud bumpstressinterface trapshot carrierannealing
 Summary | Full Text:PDF

A Simulation Methodology for Bidirectional Hot-Carrier Degradation in a Static RAM Circuit
Norio KOIKE Masato TAKEO Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/06/25
Vol. E81-C  No. 6 ; pp. 959-967
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
hot carrierbidirectional stressingcircuit reliabilitysimulation
 Summary | Full Text:PDF

Hot-Carrier Aging Simulations of Voltage Controlled Oscillator
Norio KOIKE Hirokazu NISHIMURA Masato TAKEO Tomoyuki MORII Kenichiro TATSUUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1996/09/25
Vol. E79-C  No. 9 ; pp. 1285-1288
Type of Manuscript:  LETTER
Category: Integrated Electronics
Keyword: 
hot carriercircuit reliabilitysimulationBERT
 Summary | Full Text:PDF

ESR Study of MOSFET Characteristics Degradation Mechanism by Water in Intermetal Oxide
Kazunari HARADA Naoki HOSHINO Mariko Takayanagi TAKAGI Ichiro YOSHII 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 595-600
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
waterESRhot carrierintermetal oxidesilicon dangling bond
 Summary | Full Text:PDF

Degradation Mechanisms of Thin Film SIMOX SOI-MOSFET Characteristics--Optical and Electrical Evaluation--
Mitsuru YAMAJI Kenji TANIGUSHI Chihiro HAMAGUCHI Kazuo SUKEGAWA Seiichiro KAWAMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/25
Vol. E77-C  No. 3 ; pp. 373-378
Type of Manuscript:  Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
SOI-MOSFEThot carrierphoton emissionhole trapimpact-ionizationelectron-hole recombination
 Summary | Full Text:PDF

Hot Carrier Evaluation of TFT by Emission Microscopy
Junko KOMORI Jun-ichi MITSUHASHI Shigenobu MAEDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/03/25
Vol. E77-C  No. 3 ; pp. 367-372
Type of Manuscript:  Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
hot carrierthin film transistor (TFT)emission microscopyplasma hydrogenation
 Summary | Full Text:PDF

Effects of Synchrotron X-Ray Irradiation on Hot Carrier Reliability in Subquarter-Micrometer NMOSFETs
Toshiaki TSUCHIYA Mitsuru HARADA Kimiyoshi DEGUCHI Tadahito MATSUDA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/25
Vol. E76-C  No. 4 ; pp. 506-510
Type of Manuscript:  INVITED PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies)
Category: Device Technology
Keyword: 
MOSFETreliabilityhot carriersynchrotron X-ray
 Summary | Full Text:PDF

Simulation of Velocity Overshoot and Hot Carrier Effects in Thin-Film SOI-nMOSFETs
Kazuya MATSUZAWA Minoru TAKAHASHI Makoto YOSHIMI Naoyuki SHIGYO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/12/25
Vol. E75-C  No. 12 ; pp. 1477-1483
Type of Manuscript:  Special Section PAPER (Special Issue on SOI (Si on Insulator) Devices)
Category: Hot Carrier
Keyword: 
SOIenergy transportvelocity overshoothot carrier
 Summary | Full Text:PDF