Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2005/05/01 Vol. E88-CNo. 5 ;
pp. 811-816 Type of Manuscript: Special Section PAPER (Special Section on Microelectronic Test Structures) Category: Keyword: MOSFET, photoemission, hot carrier, gate length,
A Modeling Methodology and Body Effect Analysis for Hot-Carrier Reliability Simulation of Logic Circuits Norio KOIKEHirokazu YONEZAWA
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/06/01 Vol. E85-CNo. 6 ;
pp. 1356-1366 Type of Manuscript: PAPER Category: Integrated Electronics Keyword: hot carrier, secondary hot electron, simulation,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2002/05/01 Vol. E85-CNo. 5 ;
pp. 1125-1133 Type of Manuscript: Special Section PAPER (Special Issue on Microelectronic Test Structures) Category: Keyword: test structure, MOSFET, hot carrier, photoemission,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2000/05/25 Vol. E83-ANo. 5 ;
pp. 851-856 Type of Manuscript: Special Section PAPER (Special Section on Reliability Theory and Its Applications) Category: Keyword: stud bump, stress, interface traps, hot carrier, annealing,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1996/09/25 Vol. E79-CNo. 9 ;
pp. 1285-1288 Type of Manuscript: LETTER Category: Integrated Electronics Keyword: hot carrier, circuit reliability, simulation, BERT,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/04/25 Vol. E77-CNo. 4 ;
pp. 595-600 Type of Manuscript: Special Section PAPER (Special Issue on LSI Failure Analysis) Category: Keyword: water, ESR, hot carrier, intermetal oxide, silicon dangling bond,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1994/03/25 Vol. E77-CNo. 3 ;
pp. 367-372 Type of Manuscript: Special Section PAPER (Special Issue on Quarter Micron Si Device and Process Technologies) Category: Device Technology Keyword: hot carrier, thin film transistor (TFT), emission microscopy, plasma hydrogenation,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1993/04/25 Vol. E76-CNo. 4 ;
pp. 506-510 Type of Manuscript: INVITED PAPER (Special Issue on Sub-Half Micron Si Device and Process Technologies) Category: Device Technology Keyword: MOSFET, reliability, hot carrier, synchrotron X-ray,
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 1992/12/25 Vol. E75-CNo. 12 ;
pp. 1477-1483 Type of Manuscript: Special Section PAPER (Special Issue on SOI (Si on Insulator) Devices) Category: Hot Carrier Keyword: SOI, energy transport, velocity overshoot, hot carrier,
