Keyword : highly observable condition


Testing of k-FR Circuits under Highly Observable Condition
Xiaoqing WEN Hideo TAMAMOTO Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7 ; pp. 830-838
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
testable designfault testinghighly observable conditioncircuit conversion
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