Publication:
Publication Date: 2020/04/01
Vol. E103-C
No. 4 ;
pp. 144-152
Type of Manuscript:
Special Section PAPER (Special Section on Solid-State Circuit Design — Architecture, Circuit, Device and Design Methodology)
Category: Electronic Circuits
Keyword:
single event effect, soft error, heavy ion irradiation, FDSOI, flip flop, device simulation, |
