Keyword : guide-probe diagnosis


Cone/Block Methods for Logic Simulation Time Reduction in E-Beam Guided-Probe Diagnosis
Norio KUJI Kazuhiro SHIRAKAWA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 560-566
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
logic simulationcone/block methodsguide-probe diagnosiselectron beam testing
 Summary | Full Text:PDF