Keyword : functional test


Stochastic Analysis on Hold Timing Violation in Ultra-Low Temperature Circuits for Functional Test at Room Temperature
Takahiro NAKAYAMA Masanori HASHIMOTO 
Publication:   
Publication Date: 2019/07/01
Vol. E102-A  No. 7 ; pp. 914-917
Type of Manuscript:  Special Section LETTER (Special Section on Design Methodologies for System on a Chip)
Category: 
Keyword: 
hold violationultra-low temperaturefunctional testdelay characteristic
 Summary | Full Text:PDF(334.2KB)

A DFT Controller for Instruction-Based Functional Test
Hong-Sik KIM Yong-Chun KIM Sungho KANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/08/01
Vol. E84-A  No. 8 ; pp. 2070-2072
Type of Manuscript:  LETTER
Category: VLSI Design Technology and CAD
Keyword: 
functional testscan
 Summary | Full Text:PDF(258.9KB)

A Practical Functional Test Using Flowchart for Production Testing of Microprocessor Based Sequence Controllers
Masaki HASHIZUME Takeomi TAMESADA Eiji TASAKA Toshihiro KAYAHARA Tomohisa YAMAZOE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7 ; pp. 837-841
Type of Manuscript:  Special Section LETTER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
sequence controllerprocess flowchartfunctional testmicroprocessor based circuit
 Summary | Full Text:PDF(403.4KB)