Keyword : functional fault


Testing for the Programming Circuit of SRAM-Based FPGAs
Hiroyuki MICHINISHI Tokumi YOKOHIRA Takuji OKAMOTO Tomoo INOUE Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1999/06/25
Vol. E82-D  No. 6 ; pp. 1051-1057
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
fault detectionLUT-based FPGASRAM-based FPGAfunctional faultconfiguration
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