Keyword : focused ion beam


Field-emission Characteristics of a Focused-Ion-Beam-Sharpened P-Type Silicon Single Emitter
Tomomi YOSHIMOTO Tatsuo IWATA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/04/01
Vol. E98-C  No. 4 ; pp. 371-376
Type of Manuscript:  PAPER
Category: Electron Tubes, Vacuum and Beam Technology
Keyword: 
field emissionp-type Si single emitterfocused ion beamactivation energyphotoresponse
 Summary | Full Text:PDF(998.6KB)

Fabrication of Diamond-Like Carbon Nanosprings by Focused-Ion-Beam Chemical Vapor Deposition and Evaluation of Their Mechanical Characteristics
Kenichiro NAKAMATSU Masao NAGASE Toshinari ICHIHASHI Kazuhiro KANDA Yuichi HARUYAMA Takashi KAITO Shinji MATSUI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2007/01/01
Vol. E90-C  No. 1 ; pp. 41-45
Type of Manuscript:  Special Section PAPER (Special Section on Microoptomechatronics)
Category: Micro/Nano Fabrication
Keyword: 
nanospringdiamond-like carbonfocused ion beamchemical vapor depositionmechanical characteristics
 Summary | Full Text:PDF(643.5KB)

Characterization of YBa2Cu3O7-x Co-planar Josephson Junctions Using Focused Ion Beam
Yoshihisa SOUTOME Hidehiro SHIGA Yoichi OKABE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/10/25
Vol. E81-C  No. 10 ; pp. 1538-1543
Type of Manuscript:  INVITED PAPER (Special Issue on Low- and High-Temperature Superconductive Electron Devices and Their Applications)
Category: High-Tc Junction Technology
Keyword: 
focused ion beamco-planar Josephson junction
 Summary | Full Text:PDF(844.2KB)

Investigation of High-Tc Single Flux Quantum Logic Gates
Kazuo SAITOH Hiroyuki FUKE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1997/10/25
Vol. E80-C  No. 10 ; pp. 1233-1239
Type of Manuscript:  INVITED PAPER (Special Issue on Basic Properties and Applications of Superconductive Electron Devices)
Category: 
Keyword: 
single flux quantum (SFQ)rf-SQUIDdc SQUIDfocused ion beamJosephson junctionsuperconducting weak link
 Summary | Full Text:PDF(606.7KB)

An Automated On-Chip Direct Wiring Modification for High Performance LSIs
Akio ANZAI Mikinori KAWAJI Takahiko TAKAHASHI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/02/25
Vol. E77-C  No. 2 ; pp. 263-272
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
system debuggingfocused ion beamlaser CVDwiring modificationLSI rework
 Summary | Full Text:PDF(986.5KB)