Keyword : focused ion beam (FIB)

Focused Ion Beam Applications to Failure Analysis of Si Device Chip
Kiyoshi NIKAWA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/01/25
Vol. E77-A  No. 1 ; pp. 174-179
Type of Manuscript:  Special Section PAPER (Special Section on Reliability)
Category: Failure Physics and Failure Analysis
Keyword: 
focused ion beam (FIB), scanning ion microscope (SIM), scanning electron microscope (SEM), transmission electron microscope (TEM), electron beam probing (EBP), microscopic cross-sectioning and observation, microscopic crosssectioning and elemental analysis, aluminum film microstructure observation, 
 Summary | Full Text:PDF
Redundancy Technique for Ultra-High-Speed Static RAMs
Hiroaki NAMBU Kazuo KANETANI Youji IDEI Kunihiko YAMAGUCHI Toshirou HIRAMOTO Nobuo TAMBA Kunihiko WATANABE Masanori ODAKA Takahide IKEDA Kenichi OHHATA Yoshiaki SAKURAI Noriyuki HOMMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/04/25
Vol. E76-C  No. 4 ; pp. 641-648
Type of Manuscript:  PAPER
Category: Integrated Electronics
Keyword: 
redundancy technique, static RAM (SRAM), focused ion beam (FIB), laser chemical vapor deposition (L-CVD), access time, 
 Summary | Full Text:PDF