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Keyword : focused ion beam (FIB)
Focused Ion Beam Applications to Failure Analysis of Si Device Chip
Kiyoshi NIKAWA
Publication:
IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date:
1994/01/25
Vol.
E77-A
No.
1
;
pp.
174-179
Type of Manuscript:
Special Section PAPER (Special Section on Reliability)
Category:
Failure Physics and Failure Analysis
Keyword:
focused ion beam (FIB)
,
scanning ion microscope (SIM)
,
scanning electron microscope (SEM)
,
transmission electron microscope (TEM)
,
electron beam probing (EBP)
,
microscopic cross-sectioning and observation
,
microscopic crosssectioning and elemental analysis
,
aluminum film microstructure observation
,
Summary
|
Full Text:PDF
Redundancy Technique for Ultra-High-Speed Static RAMs
Hiroaki NAMBU
Kazuo KANETANI
Youji IDEI
Kunihiko YAMAGUCHI
Toshirou HIRAMOTO
Nobuo TAMBA
Kunihiko WATANABE
Masanori ODAKA
Takahide IKEDA
Kenichi OHHATA
Yoshiaki SAKURAI
Noriyuki HOMMA
Publication:
IEICE TRANSACTIONS on Electronics
Publication Date:
1993/04/25
Vol.
E76-C
No.
4
;
pp.
641-648
Type of Manuscript:
PAPER
Category:
Integrated Electronics
Keyword:
redundancy technique
,
static RAM (SRAM)
,
focused ion beam (FIB)
,
laser chemical vapor deposition (L-CVD)
,
access time
,
Summary
|
Full Text:PDF