An Analysis of the Relationship between IDDQ Testability and D-Type Flip-Flop Structure Yukiya MIURAHiroshi YAMAZAKI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1998/10/25 Vol. E81-DNo. 10 ;
pp. 1072-1078 Type of Manuscript: PAPER Category: Fault Tolerant Computing Keyword: IDDQ testing, bridging faults, flip-flops, fault analysis,