Keyword : fault tracing


E-Beam Static Fault Imaging with a CAD Interface and Its Application to Marginal Fault Diagnosis
Norio KUJI Kiyoshi MATSUMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 552-559
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
E-beam testingfault diagnosismarginal faultfault imagefault tracing
 Summary | Full Text:PDF(733.6KB)

Automatic Tracing of Transistor-Level Performance Faults with CAD-Linked Electron Beam Test System
Katsuyoshi MIURA Koji NAKAMAE Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/03/25
Vol. E77-A  No. 3 ; pp. 539-545
Type of Manuscript:  PAPER
Category: Computer Aided Design (CAD)
Keyword: 
fault analysisfault tracingelectron beam testingperformance faulttransistor-level circuits
 Summary | Full Text:PDF(538.3KB)