Keyword : fault testing

On Fault Testing for Reversible Circuits
Satoshi TAYU Shigeru ITO Shuichi UENO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/12/01
Vol. E91-D  No. 12 ; pp. 2770-2775
Type of Manuscript:  PAPER
Category: Complexity Theory
Keyword: 
3-SAT, CNOT gate, complete test set, fault testing, NP-complete, reversible circuit, stuck-at fault, test vector, 
 Summary | Full Text:PDF
Testing of k-FR Circuits under Highly Observable Condition
Xiaoqing WEN Hideo TAMAMOTO Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7 ; pp. 830-838
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
testable design, fault testing, highly observable condition, circuit conversion, 
 Summary | Full Text:PDF