Keyword : fault model


Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
Yuzo TAKAMATSU Hiroshi TAKAHASHI Yoshinobu HIGAMI Takashi AIKYO Koji YAMAZAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 675-682
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword: 
diagnosisfault modelfault locationfault simulationcombinational circuitspass/fail information
 Summary | Full Text:PDF(491.4KB)

A New Diagnostic Method Using Probabilistic Temporal Fault Models
Kazuo HASHIMOTO Kazunori MATSUMOTO Norio SHIRATORI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/03/01
Vol. E85-D  No. 3 ; pp. 444-454
Type of Manuscript:  INVITED PAPER (Special Issue on the 2000 IEICE Excellent Paper Award)
Category: Artificial Intelligence,Cognitive Science
Keyword: 
model-based diagnosisfault modelprobabilistic temporal logicAkaike information criterion
 Summary | Full Text:PDF(809.9KB)

A Fault Model for Multiple-Valued PLA's and Its Equivalences
Yasunori NAGATA Masao MUKAIDONO 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/09/25
Vol. E77-A  No. 9 ; pp. 1527-1534
Type of Manuscript:  PAPER
Category: Computer Aided Design (CAD)
Keyword: 
equivalences of faultsfault modelmultiple-valued logicprogrammable logic arraytest compaction
 Summary | Full Text:PDF(551KB)