Keyword : fault masking


An Efficient Test and Repair Flow for Yield Enhancement of One-Time-Programming NROM-Based ROMs
Tsu-Lin LI Masaki HASHIZUME Shyue-Kung LU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2013/09/01
Vol. E96-D  No. 9 ; pp. 2026-2030
Type of Manuscript:  Special Section LETTER (Special Section on Dependable Computing)
Category: 
Keyword: 
NROMdata inversionfault maskingyield
 Summary | Full Text:PDF(573.4KB)

Design and Fault Masking of Two-Level Cellular Arrays on Multiple-Valued Logic
Naotake KAMIURA Yutaka HATA Kazuharu YAMATO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1996/10/25
Vol. E79-D  No. 10 ; pp. 1453-1461
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
multiple-valued logicfault maskingcellular array and switch cell
 Summary | Full Text:PDF(758.7KB)