Keyword : fault localization


TFIDF-FL: Localizing Faults Using Term Frequency-Inverse Document Frequency and Deep Learning
Zhuo ZHANG Yan LEI Jianjun XU Xiaoguang MAO Xi CHANG 
Publication:   
Publication Date: 2019/09/01
Vol. E102-D  No. 9 ; pp. 1860-1864
Type of Manuscript:  LETTER
Category: Software Engineering
Keyword: 
debuggingfault localizationterm frequencyinverse document frequencydeep learning
 Summary | Full Text:PDF(634.9KB)

Spectrum-Based Fault Localization Using Fault Triggering Model to Refine Fault Ranking List
Yong WANG Zhiqiu HUANG Rongcun WANG Qiao YU 
Publication:   
Publication Date: 2018/10/01
Vol. E101-D  No. 10 ; pp. 2436-2446
Type of Manuscript:  PAPER
Category: Software Engineering
Keyword: 
fault localizationsoftware debuggingtesting
 Summary | Full Text:PDF(824.9KB)

Deep Learning-Based Fault Localization with Contextual Information
Zhuo ZHANG Yan LEI Qingping TAN Xiaoguang MAO Ping ZENG Xi CHANG 
Publication:   
Publication Date: 2017/12/01
Vol. E100-D  No. 12 ; pp. 3027-3031
Type of Manuscript:  LETTER
Category: Software Engineering
Keyword: 
fault localizationdynamic slicedeep learningcontextual information
 Summary | Full Text:PDF(4.4MB)

The Impact of Information Richness on Fault Localization
Yan LEI Min ZHANG Bixin LI Jingan REN Yinhua JIANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/01/01
Vol. E99-D  No. 1 ; pp. 265-269
Type of Manuscript:  LETTER
Category: Software Engineering
Keyword: 
fault localizationautomated debugginginformation richnessexperimental study
 Summary | Full Text:PDF(202.1KB)

Delay Defect Diagnosis Methodology Using Path Delay Measurements
Eun Jung JANG Jaeyong CHUNG Jacob A. ABRAHAM 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/10/01
Vol. E98-C  No. 10 ; pp. 991-994
Type of Manuscript:  BRIEF PAPER
Category: Semiconductor Materials and Devices
Keyword: 
VLSI testingdelay faultsdelay defectsdefect diagnosisfault localization
 Summary | Full Text:PDF(396.6KB)

Fault Localization Using Failure-Related Contexts for Automatic Program Repair
Ang LI Xiaoguang MAO Yan LEI Tao JI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2015/04/01
Vol. E98-D  No. 4 ; pp. 955-959
Type of Manuscript:  LETTER
Category: Software Engineering
Keyword: 
automatic repairfault localizationfailure-related contextprogram slicingsuspiciousness evaluation
 Summary | Full Text:PDF(336KB)

Applying Association Analysis to Dynamic Slicing Based Fault Localization
Heling CAO Shujuan JIANG Xiaolin JU Yanmei ZHANG Guan YUAN 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/08/01
Vol. E97-D  No. 8 ; pp. 2057-2066
Type of Manuscript:  PAPER
Category: Software Engineering
Keyword: 
dynamic slicingfault localizationassociation analysisexecution trace
 Summary | Full Text:PDF(403.1KB)

Enriching Contextual Information for Fault Localization
Zhuo ZHANG Xiaoguang MAO Yan LEI Peng ZHANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2014/06/01
Vol. E97-D  No. 6 ; pp. 1652-1655
Type of Manuscript:  LETTER
Category: Software Engineering
Keyword: 
fault localizationdynamic sliceprogram spectrumcontextual information
 Summary | Full Text:PDF(1.2MB)

Detection and Localization of Link Quality Degradation in Transparent WDM Networks
Wissarut YUTTACHAI Poompat SAENGUDOMLERT Wuttipong KUMWILAISAK 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2013/06/01
Vol. E96-B  No. 6 ; pp. 1412-1424
Type of Manuscript:  PAPER
Category: Fiber-Optic Transmission for Communications
Keyword: 
estimationfault localizationnetwork tomographyOSNRWDM networks
 Summary | Full Text:PDF(1.4MB)

Effective Fault Localization Approach Using Feedback
Yan LEI Xiaoguang MAO Ziying DAI Dengping WEI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2012/09/01
Vol. E95-D  No. 9 ; pp. 2247-2257
Type of Manuscript:  PAPER
Category: Software Engineering
Keyword: 
fault localizationsoftware debuggingprogram spectrafeedback
 Summary | Full Text:PDF(1.4MB)

Reducing the Inaccuracy Caused by Inappropriate Time Window in Probabilistic Fault Localization
Jianxin LIAO Cheng ZHANG Tonghong LI Xiaomin ZHU 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2011/01/01
Vol. E94-B  No. 1 ; pp. 128-138
Type of Manuscript:  PAPER
Category: Network Management/Operation
Keyword: 
fault diagnosisfault localizationfault propagation modeltime windowevent-driven
 Summary | Full Text:PDF(1.4MB)

EB Tester Line Delay Fault Localization Algorithm for Combinational Circuits Considering CAD Layout
Kazuhiro NOMURA Koji NAKAMAE Hiromu FUJIOKA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1564-1570
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: EB Tester
Keyword: 
EB testerline delay faultfault localizationlayout analysiscombinational circuits
 Summary | Full Text:PDF(296.4KB)

Highly Sensitive OBIRCH System for Fault Localization and Defect Detection
Kiyoshi NIKAWA Shoji INOUE 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/07/25
Vol. E81-D  No. 7 ; pp. 743-748
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Diagnosis of VLSI)
Category: Beam Testing/Diagnosis
Keyword: 
VLSI chipfault localizationmetal line defect detectionhigh resistivityTiSiAlreliabilityyieldfailure analysis
 Summary | Full Text:PDF(916.7KB)

Fault Localization and Supervisory Channel Implementation for Optical Linear-Repeaters in SDH/SONET-Based Networks
Shinji MATSUOKA Kazuyuki MATSHUMURA Yoshiaki SATO Yukio KOBAYASHI Kazuo HAGIMOTO 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1996/10/25
Vol. E79-B  No. 10 ; pp. 1549-1557
Type of Manuscript:  PAPER
Category: Optical Communication
Keyword: 
SDHoptical amplifiersupervisory systemlinear repeaterfault localization
 Summary | Full Text:PDF(868.9KB)

A New Conformance Testing Technique for Localization of Multiple Faults in Communication Protocols
Yoshiaki KAKUDA Hideki YUKITOMO Shinji KUSUMOTO Tohru KIKUNO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/07/25
Vol. E78-D  No. 7 ; pp. 802-810
Type of Manuscript:  Special Section PAPER (Special Issue on Verification, Test and Diagnosis of VLSI Systems)
Category: 
Keyword: 
software testingcommunication protocolconformance testingfault localizationtest sequence
 Summary | Full Text:PDF(729KB)