Keyword : fault image


E-Beam Static Fault Imaging with a CAD Interface and Its Application to Marginal Fault Diagnosis
Norio KUJI Kiyoshi MATSUMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/04/25
Vol. E77-C  No. 4 ; pp. 552-559
Type of Manuscript:  Special Section PAPER (Special Issue on LSI Failure Analysis)
Category: 
Keyword: 
E-beam testingfault diagnosismarginal faultfault imagefault tracing
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