Publication: Publication Date: 2022/02/01 Vol. E105-DNo. 2 ;
pp. 344-354 Type of Manuscript: PAPER Category: Information Network Keyword: SFC, fault analysis, INT, LSTM, SVM,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2015/06/01 Vol. E98-DNo. 6 ;
pp. 1150-1160 Type of Manuscript: Special Section PAPER (Special Section on Formal Approach) Category: Model Checking Keyword: model checking, fault analysis, model transformation,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2012/01/01 Vol. E95-ANo. 1 ;
pp. 242-251 Type of Manuscript: Special Section PAPER (Special Section on Cryptography and Information Security) Category: Implementation Keyword: fault analysis, differential fault analysis (DFA), stream cipher, side-channel analysis, MUGI,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2011/04/01 Vol. E94-ANo. 4 ;
pp. 1156-1158 Type of Manuscript: LETTER Category: Cryptography and Information Security Keyword: NTRU, side channel attacks, fault analysis, public key cryptography,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2011/02/01 Vol. E94-ANo. 2 ;
pp. 855-859 Type of Manuscript: LETTER Category: Cryptography and Information Security Keyword: fault analysis, authentication protocols, HB+ protocol, RFID systems,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2010/01/01 Vol. E93-ANo. 1 ;
pp. 172-179 Type of Manuscript: Special Section PAPER (Special Section on Cryptography and Information Security) Category: Cryptanalysis Keyword: fault analysis, random switching logic, AES, clock-based fault analysis attack,
Analysis and Testing of Bridging Faults in CMOS Synchronous Sequential Circuits Yukiya MIURA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-DNo. 3 ;
pp. 564-570 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Fault Detection Keyword: bridging faults, CMOS synchronous sequential circuits, fault analysis, testing,
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2001/04/01 Vol. E84-DNo. 4 ;
pp. 534-536 Type of Manuscript: LETTER Category: Computer System Element Keyword: IDDQ testing, bridging fault, fault analysis,
An Analysis of the Relationship between IDDQ Testability and D-Type Flip-Flop Structure Yukiya MIURAHiroshi YAMAZAKI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1998/10/25 Vol. E81-DNo. 10 ;
pp. 1072-1078 Type of Manuscript: PAPER Category: Fault Tolerant Computing Keyword: IDDQ testing, bridging faults, flip-flops, fault analysis,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1995/12/25 Vol. E78-ANo. 12 ;
pp. 1627-1633 Type of Manuscript: Special Section PAPER (Special Section on Acoustic Diagnosis) Category: Keyword: machine diagnosis, acoustic signal processing, fault analysis, digital signal processing,
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/01/25 Vol. E77-ANo. 1 ;
pp. 195-203 Type of Manuscript: Special Section PAPER (Special Section on Reliability) Category: Reliability Testing Keyword: fault analysis, testing and verification, reliability, availability and vulnerability,