Keyword : failure


Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data
Zheng-Liang HUANG Fa-Xin YU Shu-Ting ZHANG Hao LUO Ping-Hui WANG Yao ZHENG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/09/01
Vol. E92-A  No. 9 ; pp. 2376-2379
Type of Manuscript:  LETTER
Category: Reliability, Maintainability and Safety Analysis
Keyword: 
MMICsreliabilityfailureaccelerated testingWeibull distributionlognormal distribution
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Comparison of Power Dissipation Tolerance of InP/InGaAs UTC-PDs and Pin-PDs
Takako YASUI Tomofumi FURUTA Tadao ISHIBASHI Hiroshi ITO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/05/01
Vol. E86-C  No. 5 ; pp. 864-866
Type of Manuscript:  LETTER
Category: Lasers, Quantum Electronics
Keyword: 
photodiodeuni-travelling-carrier photodiodehigh power optical inputfailure
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New Self-Healing Scheme that Realizes Multiple Reliability on ATM Networks
Taishi YAHARA Ryutaro KAWAMURA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2000/12/25
Vol. E83-B  No. 12 ; pp. 2615-2625
Type of Manuscript:  PAPER
Category: Switching
Keyword: 
restorationself-healingfailurereliabilityATM
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Resilient Self-Sizing ATM Network Operation and Its Evaluation
Hiroyoshi MIWA Jiro YAMADA Ichiro IDE Toyofumi TAKENAKA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1998/10/25
Vol. E81-B  No. 10 ; pp. 1789-1796
Type of Manuscript:  PAPER
Category: Communication Networks and Services
Keyword: 
ATMself-sizingnetwork operationvirtual pathfailurerobustness
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A Failure-Resistant Self-Healing Scheme in ATM Networks
Ryutaro KAWAMURA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1998/04/25
Vol. E81-B  No. 4 ; pp. 699-705
Type of Manuscript:  PAPER
Category: Communication Networks and Services
Keyword: 
self-healingrestorationfailureATMVirtual Path
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Spare-Channel Design Schemes for Self-Healing Networks
Hideki SAKAUCHI Yasuyo OKANOUE Satoshi HASEGAWA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1992/07/25
Vol. E75-B  No. 7 ; pp. 624-633
Type of Manuscript:  Special Section PAPER (Special Section on Network Planning)
Category: 
Keyword: 
sparedesignfailurerestorationnetwork
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1/5 Power Law in PN-Junction Failure Mechanism Caused by Electrical-Over-Stress
Yutaka TAJIMA Kunihiro ASADA Takuo SUGANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1992/02/25
Vol. E75-C  No. 2 ; pp. 207-215
Type of Manuscript:  Special Section PAPER (Special Issue on Selected Papers from '91 VPAD)
Category: 
Keyword: 
reliabilityfailurepn-junctionsiliconelectrostatic-discharge
 Summary | Full Text:PDF(615.1KB)