Keyword : fail bit map data

Automatic Defect Classification System in Semiconductors EDS Test Based on System Entity Structure Methodology
Young-Shin HAN SoYoung KIM TaeKyu KIM Jason J. JUNG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2010/07/01
Vol. E93-D  No. 7 ; pp. 2001-2004
Type of Manuscript:  LETTER
Category: Artificial Intelligence, Data Mining
semiconductorsystem entity structureelectrical die sortingfail bit map datapruning
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