Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1998/12/25
Vol. E81-A
No. 12 ;
pp. 2640-2645
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Test
Keyword:
testing time, core-based system LSI, BIST, external testing, |
