Keyword : event-driven

Reducing the Inaccuracy Caused by Inappropriate Time Window in Probabilistic Fault Localization
Jianxin LIAO Cheng ZHANG Tonghong LI Xiaomin ZHU 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2011/01/01
Vol. E94-B  No. 1 ; pp. 128-138
Type of Manuscript:  PAPER
Category: Network Management/Operation
fault diagnosisfault localizationfault propagation modeltime windowevent-driven
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A Precise Event-Driven MOS Circhit Simulator
Tetsuro KAGE Hisanori FUJISAWA Fumiyo KAWAFUJI Tomoyasu KITAURA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1996/03/25
Vol. E79-A  No. 3 ; pp. 339-346
Type of Manuscript:  Special Section PAPER (Special Section of Selected Papers from the 8th Karuizawa Workshop on Circuits and Systems)
Mos circuit simulationDC-connected componentevent-driventime-step controlmulti-rate behavior
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