Keyword : error identification


Error Identification in At-Speed Scan BIST Environment in the Presence of Circuit and Tester Speed Mismatch
Yoshiyuki NAKAMURA Thomas CLOUQUEUR Kewal K. SALUJA Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/03/01
Vol. E89-D  No. 3 ; pp. 1165-1172
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
BISTfault diagnosiserror identificationat-speed testlow speed tester
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