Keyword : emitter ledge


Determining GaInP/GaAs HBT Device Structure by DC Measurements on a Two-Emitter HBT Device and High Frequency Transit Time Measurements
Chinchun MENG Bo-Chen TSOU Sheng-Che TSENG 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/06/01
Vol. E88-C  No. 6 ; pp. 1127-1132
Type of Manuscript:  Special Section PAPER (Special Section on Analog Circuit and Device Technologies)
Category: Device
Keyword: 
GaInP/GaAs HBTemitter ledgetransit time measurement
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