Keyword : embedded core testing


A Clustered RIN BIST Based on Signal Probabilities of Deterministic Test Sets
Dong-Sup SONG Sungho KANG 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/01/01
Vol. E89-D  No. 1 ; pp. 354-357
Type of Manuscript:  LETTER
Category: Dependable Computing
Keyword: 
deterministic logic BISTembedded core testing
 Summary | Full Text:PDF

Hierarchical Intellectual Property Protection Using Partially-Mergeable Cores
Vikram IYENGAR Hiroshi DATE Makoto SUGIHARA Krishnendu CHAKRABARTY 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2001/11/01
Vol. E84-A  No. 11 ; pp. 2632-2638
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: IP Protection
Keyword: 
core partitioningembedded core testingintellectual propertypartially-mergeable corestest access mechanism (TAM)
 Summary | Full Text:PDF