Publication: IEICE TRANSACTIONS on Electronics
Publication Date: 1994/08/25
Vol. E77-C
No. 8 ;
pp. 1287-1295
Type of Manuscript:
Special Section PAPER (Special Section on High Speed and High Density Multi Functional LSI Memories)
Category: Non-volatile Memory
Keyword:
flash EEPROM, data retention, endurance, tunnel oxide, electron traps, |
