Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2003/07/01 Vol. E86-CNo. 7 ;
pp. 1345-1351 Type of Manuscript: INVITED PAPER (Special Issue on Recent Progress in Microwave and Millimeter-wave Photonics Technologies) Category: Measurements Techniques Keyword: millimeter wave, electric field, imaging, scanner, electro-optic crystal,