Keyword : electrical test

A Built-in Test Circuit for Electrical Interconnect Testing of Open Defects in Assembled PCBs
Widiant Masaki HASHIZUME Shohei SUENAGA Hiroyuki YOTSUYANAGI Akira ONO Shyue-Kung LU Zvi ROTH 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2016/11/01
Vol. E99-D  No. 11 ; pp. 2723-2733
Type of Manuscript:  PAPER
Category: Dependable Computing
electrical testbuilt-in test circuitopen defectinterconnect testdesign for testability
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