Keyword : electric field


Crystal Axis Control of Soluble Organic Semiconductors in Nematic Liquid Crystal Solvents Based on Electric Field
Tomoya MATSUZAKI Takahiro ISHINABE Hideo FUJIKAKE 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/11/01
Vol. E98-C  No. 11 ; pp. 1032-1034
Type of Manuscript:  BRIEF PAPER
Category: 
Keyword: 
organic semiconductorliquid crystal solventssingle crystalelectric field
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Analysis of Carrier Behaviors in Double-layer Organic Devices by Displacement Current Measurement and Electric-field-induced Optical Second-harmonic Generation Measurement
Taishi NOMA Dai TAGUCHI Takaaki MANAKA Mitsumasa IWAMOTO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2015/02/01
Vol. E98-C  No. 2 ; pp. 86-90
Type of Manuscript:  Special Section PAPER (Special Section on Recent Progress in Organic Molecular Electronics)
Category: 
Keyword: 
EFISHGDCMinterfacial chargeselectric field
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Estimation of Multiple Coherent Source Locations by Using SPM Method Combined with Signal Subspace Fitting Technique
Yuzo YOSHIMOTO Kazumasa TAIRA Kunio SAWAYA Risaburo SATO 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2005/08/01
Vol. E88-B  No. 8 ; pp. 3164-3169
Type of Manuscript:  Special Section PAPER (Special Section of 2004 International Symposium on Electromagnetic Compatibility)
Category: Measurements
Keyword: 
EMCelectric fieldSPM methodWSF methodcalibrationestimation of electromagnetic source location
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Characterization and Modeling of Gate-Induced-Drain-Leakage
Fabien GILIBERT Denis RIDEAU Alexandre DRAY Francois AGUT Michel MINONDO Andre JUGE Pascal MASSON Rachid BOUCHAKOUR 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/05/01
Vol. E88-C  No. 5 ; pp. 829-837
Type of Manuscript:  Special Section PAPER (Special Section on Microelectronic Test Structures)
Category: 
Keyword: 
GIDLcompact modelMOSFETelectric fieldtrap assisted tunneling
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Effects of Electric Field on Metal-Induced Lateral Crystallization under Limited Ni-Supply Condition
Gou NAKAGAWA Noritoshi SHIBATA Tanemasa ASANO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2005/04/01
Vol. E88-C  No. 4 ; pp. 662-666
Type of Manuscript:  Special Section PAPER (Special Section on Fundamental and Application of Advanced Semiconductor Devices)
Category: Thin Film Transistors
Keyword: 
poly-SiTFTmetal-induced lateral crystallizationneedle-like SiNi-silicideelectric field
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Lead Open Detection Based on Supply Current of CMOS LSIs
Masao TAKAGI Masaki HASHIZUME Masahiro ICHIMIYA Hiroyuki YOTSUYANAGI Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2004/06/01
Vol. E87-A  No. 6 ; pp. 1330-1337
Type of Manuscript:  Special Section PAPER (Special Section on Papers Selected from 2003 International Technical Conference on Circuits/Systems, Computers and Communications (ITC-CSCC 2003))
Category: 
Keyword: 
lead openCMOS LSIsupply current testelectric field
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Test Pattern Generation for CMOS Open Defect Detection by Supply Current Testing under AC Electric Field
Hiroyuki YOTSUYANAGI Taisuke IWAKIRI Masaki HASHIZUME Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2003/12/01
Vol. E86-D  No. 12 ; pp. 2666-2673
Type of Manuscript:  Special Section PAPER (Special Issue on Dependable Computing)
Category: Test
Keyword: 
open defectssupply current testCMOS circuitselectric field
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Electric-Field Scanning System Using Electro-Optic Sensor
Ai-ichiro SASAKI Tadao NAGATSUMA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2003/07/01
Vol. E86-C  No. 7 ; pp. 1345-1351
Type of Manuscript:  INVITED PAPER (Special Issue on Recent Progress in Microwave and Millimeter-wave Photonics Technologies)
Category: Measurements Techniques
Keyword: 
millimeter waveelectric fieldimagingscannerelectro-optic crystal
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CMOS Open Defect Detection by Supply Current Measurement under Time-Variable Electric Field Supply
Masaki HASHIZUME Masahiro ICHIMIYA Hiroyuki YOTSUYANAGI Takeomi TAMESADA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1542-1550
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Current Test
Keyword: 
open defectCMOSsupply current testelectric field
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Electromagnetic Environments Generated by Power Transmission System
Seietsu TOMITA 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1995/02/25
Vol. E78-B  No. 2 ; pp. 120-126
Type of Manuscript:  INVITED PAPER (Special Issue on Electromagnetic Compatibility)
Category: 
Keyword: 
power frequencyelectric fieldmagnetic fielddischargesharmonics
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Measurements of Power Frequency Electromagnetic Environments and Consideration into Exposure Evaluation
Katsuo ISAKA Noriyuki HAYASHI Masatoshi OKAMOTO Yoshihide YOKOI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 1994/06/25
Vol. E77-B  No. 6 ; pp. 699-707
Type of Manuscript:  INVITED PAPER (Special Issue on Biological Effects of Electromagnetic Fields)
Category: 
Keyword: 
electric fieldmagnetic fieldpower frequencydosimeterdosimetry
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