Keyword : easily testable realization


Easily Testable Realization Based on Single-Rail-Input OR-AND-EXOR Expressions
Takashi HIRAYAMA Goro KODA Yasuaki NISHITANI Kensuke SHIMIZU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1999/09/25
Vol. E82-D  No. 9 ; pp. 1278-1286
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
logic synthesisexclusive-orsingle stuck-at faulteasily testable realization
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