Keyword : easily testable design


A 2-Rail Logic Combinational Circuit for Easy Detection of Stuck-Open and Stuck-On Faults in FETs
Hideo ITO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1992/11/25
Vol. E75-D  No. 6 ; pp. 894-901
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
easily testable designCMOSstuck-open faultstuck-on fault2-rail logic
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