Keyword : dielectric constant


Electrical Properties of Ba0.5Sr0.5Ta2O6 Thin Film Fabricated by Sol-Gel Method
Li LU Masahiro ECHIZEN Takashi NISHIDA Kiyoshi UCHIYAMA Yukiharu URAOKA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2010/10/01
Vol. E93-C  No. 10 ; pp. 1511-1515
Type of Manuscript:  Special Section PAPER (Special Section on Frontier of Thin-Film Transistor Technology)
Category: 
Keyword: 
Ba0.5Sr0.5Ta2O6gate oxidedielectric constantleakage current
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Development of an Estimation System for the Relative Dielectric Constant of Liquid Materials
Toshihide TOSAKA Isamu NAGANO Satoshi YAGITANI 
Publication:   IEICE TRANSACTIONS on Communications
Publication Date: 2005/04/01
Vol. E88-B  No. 4 ; pp. 1746-1747
Type of Manuscript:  LETTER
Category: Electromagnetic Compatibility(EMC)
Keyword: 
dielectric constantSommerfeld integralestimation systemliquid
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Effects of Post-Annealing on Dielectric Properties of (Ba, Sr)TiO3 Thin Films Prepared by Liquid Source Chemical Vapor Deposition
Tsuyoshi HORIKAWA Junji TANIMURA Takaaki KAWAHARA Mikio YAMAMUKA Masayoshi TARUTANI Kouichi ONO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 497-504
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films)
Category: 
Keyword: 
chemical vapor deposition(Ba,Sr)TiO3annealingdielectric constantdielectric breakdown
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Di/Ferroelectric Properties of Bismuth Based Layered Ferroelectric Films for Application to Non-volatile Memories
Hitoshi TABATA Takeshi YANAGITA Tomoji KAWAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1998/04/25
Vol. E81-C  No. 4 ; pp. 566-571
Type of Manuscript:  Special Section PAPER (Special Issue on Advanced Memory Devices Using High-Dielectric-Constant and Ferroelectric Thin Films)
Category: 
Keyword: 
ferroelectric thin filmnon volatile memoryBi base layer structured ferroelectrics laser ablationdielectric constantFeRAM
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A Method for Measuring Surface Impedance of Superconductor and Dielectric Characteristics of Substrate by Using Strip Line Resonator
Akira TAKETOMI Kunio SAWAYA Saburo ADACHI Shigetoshi OHSHIMA Norihiko YAOI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1994/08/25
Vol. E77-C  No. 8 ; pp. 1234-1241
Type of Manuscript:  Special Section PAPER (Special Section on Superconducting Devices)
Category: HTS
Keyword: 
surface impedancemicrostrip line resonatordielectric constantloss tangent
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