Keyword : diagnostic vector generation


Transistor Leakage Fault Diagnosis with IDDQ and Logic Information
Wen XIAOQING Hideo TAMAMOTO Kewal K. SALUJA Kozo KINOSHITA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1998/04/25
Vol. E81-D  No. 4 ; pp. 372-381
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
fault diagnosistransistor leakage faultIDDQ testingfault simulationdiagnostic vector generation
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