IEICE Trans

Keyword : diagnosis

Diagnosis of Stochastic Discrete Event Systems Based on N-Gram Models with Wildcard Characters Kunihiko HIRAISHI Koichi KOBAYASHI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2016/02/01 Vol. E99-A No. 2 ; pp. 462-467 Type of Manuscript: Special Section PAPER (Special Section on Mathematical Systems Science and its Applications) Category: Keyword: discrete event systems, diagnosis, N-gram model, wildcard character,
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Diagnosis of Stochastic Discrete Event Systems Based on N-gram Models Miwa YOSHIMOTO Koichi KOBAYASHI Kunihiko HIRAISHI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2015/02/01 Vol. E98-A No. 2 ; pp. 618-625 Type of Manuscript: Special Section PAPER (Special Section on Mathematical Systems Science and its Applications) Category: Keyword: stochastic discrete event systems, diagnosis, N-gram models,
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An Efficient Fault Syndromes Simulator for SRAM Memories Wan Zuha WAN HASAN Izhal ABD HALIN Roslina MOHD SIDEK Masuri OTHMAN
Publication: IEICE TRANSACTIONS on Electronics Publication Date: 2009/05/01 Vol. E92-C No. 5 ; pp. 639-646 Type of Manuscript: Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices) Category: Keyword: testing, diagnosis, coupling faults, stuck-at faults March test algorithm, built-in self-test (BIST), built-in self-diagnosis (BISD), automated march-based test algorithm, SRAM,
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Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information Yuzo TAKAMATSU Hiroshi TAKAHASHI Yoshinobu HIGAMI Takashi AIKYO Koji YAMAZAKI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2008/03/01 Vol. E91-D No. 3 ; pp. 675-682 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSIs) Category: Fault Diagnosis Keyword: diagnosis, fault model, fault location, fault simulation, combinational circuits, pass/fail information,
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An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults Jin-Fu LI Chao-Da HUANG
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2007/12/01 Vol. E90-A No. 12 ; pp. 2703-2711 Type of Manuscript: Special Section PAPER (Special Section on VLSI Design and CAD Algorithms) Category: Memory Design and Test Keyword: diagnosis, random access memories, March test, built-in self-diagnosis, coupling faults,
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Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns James Chien-Mo LI
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 2005/04/01 Vol. E88-A No. 4 ; pp. 1024-1030 Type of Manuscript: PAPER Category: VLSI Design Technology and CAD Keyword: diagnosis, design for testability, delay fault testing,
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Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration Yasuo SATO Iwao YAMAZAKI Hiroki YAMANAKA Toshio IKEDA Masahiro TAKAKURA Kazuhiko IWASAKI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/09/01 Vol. E87-D No. 9 ; pp. 2179-2185 Type of Manuscript: PAPER Category: Dependable Computing Keyword: diagnosis, open fault, coupling effect,
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Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults Jin-Fu LI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-D No. 3 ; pp. 601-608 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Memory Testing Keyword: content addressable memories, testing, diagnosis, march test,
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Fault Diagnosis for RAMs Using Walsh Spectrum Atsumu ISENO Yukihiro IGUCHI Tsutomu SASAO
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2004/03/01 Vol. E87-D No. 3 ; pp. 592-600 Type of Manuscript: Special Section PAPER (Special Section on Test and Verification of VLSI) Category: Memory Testing Keyword: memory test, diagnosis, BIST, fail-bitmap, Walsh spectrum,
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Diagnosing Crosstalk Faults in Sequential Circuits Using Fault Simulation Hiroshi TAKAHASHI Marong PHADOONGSIDHI Yoshinobu HIGAMI Kewal K. SALUJA Yuzo TAKAMATSU
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 2002/10/01 Vol. E85-D No. 10 ; pp. 1515-1525 Type of Manuscript: Special Section PAPER (Special Issue on Test and Verification of VLSI) Category: Test and Diagnosis for Timing Faults Keyword: diagnosis, crosstalk fault, fault simulation, sequential circuit,
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A Structured Walking-1 Approach for the Diagnosis of Interconnects and FPICs^* Tong LIU Fabrizio LOMBARDI Susumu HORIGUCHI Jung Hwan KIM
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1996/01/25 Vol. E79-D No. 1 ; pp. 29-40 Type of Manuscript: PAPER Category: Fault Tolerant Computing Keyword: interconnect testing, FPIC testing, diagnosis, syndrome,
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A Separation of Electroretinograms for Diabetic Retinopathy Yutaka MAEDA Takayuki AKASHI Yakichi KANATA
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1995/08/25 Vol. E78-D No. 8 ; pp. 1087-1092 Type of Manuscript: PAPER Category: Medical Electronics and Medical Information Keyword: separation, discriminant analysis, electroretinogram, diabetic retinopathy, diagnosis,
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On Solutions of the Element-Value Determinability Problem of Linear Analog Circuits Shoji SHINODA Kumiko OKADA
Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences Publication Date: 1994/07/25 Vol. E77-A No. 7 ; pp. 1132-1143 Type of Manuscript: Special Section PAPER (Special Section on Surveys of Researches in CAS Fields in the Last Two Decades, ) Category: Keyword: analog circuit, diagnosis, element-value determinability, unistor circuit model, dendroid,
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The Role of Student Models in Learning Environments John SELF
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1994/01/25 Vol. E77-D No. 1 ; pp. 3-8 Type of Manuscript: Special Section PAPER (Special Issue on Intelligent CAI and Hypermedia) Category: Keyword: student models, diagnosis, tutoring systems,
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REDUCT: A Redundant Fault Identification Algorithm Using Circuit Reduction Techniques Miyako TANDAI Takao SHINSHA Takao NISHIDA Kaoru MORIWAKI
Publication: IEICE TRANSACTIONS on Information and Systems Publication Date: 1993/07/25 Vol. E76-D No. 7 ; pp. 776-790 Type of Manuscript: Special Section PAPER (Special Issue on VLSI Testing and Testable Design) Category: Keyword: hardware and design, algorithm, diagnosis, test pattern generation, redundant fault,
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