Keyword : diagnosis


Diagnosis of Stochastic Discrete Event Systems Based on N-Gram Models with Wildcard Characters
Kunihiko HIRAISHI Koichi KOBAYASHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2016/02/01
Vol. E99-A  No. 2 ; pp. 462-467
Type of Manuscript:  Special Section PAPER (Special Section on Mathematical Systems Science and its Applications)
Category: 
Keyword: 
discrete event systemsdiagnosisN-gram modelwildcard character
 Summary | Full Text:PDF(714.5KB)

Diagnosis of Stochastic Discrete Event Systems Based on N-gram Models
Miwa YOSHIMOTO Koichi KOBAYASHI Kunihiko HIRAISHI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2015/02/01
Vol. E98-A  No. 2 ; pp. 618-625
Type of Manuscript:  Special Section PAPER (Special Section on Mathematical Systems Science and its Applications)
Category: 
Keyword: 
stochastic discrete event systemsdiagnosisN-gram models
 Summary | Full Text:PDF(1MB)

An Efficient Fault Syndromes Simulator for SRAM Memories
Wan Zuha WAN HASAN Izhal ABD HALIN Roslina MOHD SIDEK Masuri OTHMAN 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2009/05/01
Vol. E92-C  No. 5 ; pp. 639-646
Type of Manuscript:  Special Section PAPER (Special Section on Fundamentals and Applications of Advanced Semiconductor Devices)
Category: 
Keyword: 
testingdiagnosiscoupling faultsstuck-at faults March test algorithmbuilt-in self-test (BIST)built-in self-diagnosis (BISD)automated march-based test algorithmSRAM
 Summary | Full Text:PDF(1.8MB)

Fault Diagnosis on Multiple Fault Models by Using Pass/Fail Information
Yuzo TAKAMATSU Hiroshi TAKAHASHI Yoshinobu HIGAMI Takashi AIKYO Koji YAMAZAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D  No. 3 ; pp. 675-682
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Fault Diagnosis
Keyword: 
diagnosisfault modelfault locationfault simulationcombinational circuitspass/fail information
 Summary | Full Text:PDF(491.4KB)

An Efficient Diagnosis Scheme for RAMs with Simple Functional Faults
Jin-Fu LI Chao-Da HUANG 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2007/12/01
Vol. E90-A  No. 12 ; pp. 2703-2711
Type of Manuscript:  Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category: Memory Design and Test
Keyword: 
diagnosisrandom access memoriesMarch testbuilt-in self-diagnosiscoupling faults
 Summary | Full Text:PDF(276.5KB)

Diagnosis of Timing Faults in Scan Chains Using Single Excitation Patterns
James Chien-Mo LI 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2005/04/01
Vol. E88-A  No. 4 ; pp. 1024-1030
Type of Manuscript:  PAPER
Category: VLSI Design Technology and CAD
Keyword: 
diagnosisdesign for testabilitydelay fault testing
 Summary | Full Text:PDF(639.3KB)

Technique to Diagnose Open Defects that Takes Coupling Effects into Consideration
Yasuo SATO Iwao YAMAZAKI Hiroki YAMANAKA Toshio IKEDA Masahiro TAKAKURA Kazuhiko IWASAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/09/01
Vol. E87-D  No. 9 ; pp. 2179-2185
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
diagnosisopen faultcoupling effect
 Summary | Full Text:PDF(439.5KB)

Diagnosing Binary Content Addressable Memories with Comparison and RAM Faults
Jin-Fu LI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 601-608
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Memory Testing
Keyword: 
content addressable memoriestestingdiagnosismarch test
 Summary | Full Text:PDF(437KB)

Fault Diagnosis for RAMs Using Walsh Spectrum
Atsumu ISENO Yukihiro IGUCHI Tsutomu SASAO 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2004/03/01
Vol. E87-D  No. 3 ; pp. 592-600
Type of Manuscript:  Special Section PAPER (Special Section on Test and Verification of VLSI)
Category: Memory Testing
Keyword: 
memory testdiagnosisBISTfail-bitmapWalsh spectrum
 Summary | Full Text:PDF(717.5KB)

Diagnosing Crosstalk Faults in Sequential Circuits Using Fault Simulation
Hiroshi TAKAHASHI Marong PHADOONGSIDHI Yoshinobu HIGAMI Kewal K. SALUJA Yuzo TAKAMATSU 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2002/10/01
Vol. E85-D  No. 10 ; pp. 1515-1525
Type of Manuscript:  Special Section PAPER (Special Issue on Test and Verification of VLSI)
Category: Test and Diagnosis for Timing Faults
Keyword: 
diagnosiscrosstalk faultfault simulationsequential circuit
 Summary | Full Text:PDF(870.8KB)

A Structured Walking-1 Approach for the Diagnosis of Interconnects and FPICs*
Tong LIU Fabrizio LOMBARDI Susumu HORIGUCHI Jung Hwan KIM 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1996/01/25
Vol. E79-D  No. 1 ; pp. 29-40
Type of Manuscript:  PAPER
Category: Fault Tolerant Computing
Keyword: 
interconnect testingFPIC testingdiagnosissyndrome
 Summary | Full Text:PDF(1001.5KB)

A Separation of Electroretinograms for Diabetic Retinopathy
Yutaka MAEDA Takayuki AKASHI Yakichi KANATA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1995/08/25
Vol. E78-D  No. 8 ; pp. 1087-1092
Type of Manuscript:  PAPER
Category: Medical Electronics and Medical Information
Keyword: 
separationdiscriminant analysiselectroretinogramdiabetic retinopathydiagnosis
 Summary | Full Text:PDF(533.5KB)

On Solutions of the Element-Value Determinability Problem of Linear Analog Circuits
Shoji SHINODA Kumiko OKADA 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1994/07/25
Vol. E77-A  No. 7 ; pp. 1132-1143
Type of Manuscript:  Special Section PAPER (Special Section on Surveys of Researches in CAS Fields in the Last Two Decades, )
Category: 
Keyword: 
analog circuitdiagnosiselement-value determinabilityunistor circuit modeldendroid
 Summary | Full Text:PDF(1.1MB)

The Role of Student Models in Learning Environments
John SELF 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1994/01/25
Vol. E77-D  No. 1 ; pp. 3-8
Type of Manuscript:  Special Section PAPER (Special Issue on Intelligent CAI and Hypermedia)
Category: 
Keyword: 
student modelsdiagnosistutoring systems
 Summary | Full Text:PDF(571.7KB)

REDUCT: A Redundant Fault Identification Algorithm Using Circuit Reduction Techniques
Miyako TANDAI Takao SHINSHA Takao NISHIDA Kaoru MORIWAKI 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 1993/07/25
Vol. E76-D  No. 7 ; pp. 776-790
Type of Manuscript:  Special Section PAPER (Special Issue on VLSI Testing and Testable Design)
Category: 
Keyword: 
hardware and designalgorithmdiagnosistest pattern generationredundant fault
 Summary | Full Text:PDF(1.1MB)