Keyword : device variation

A Novel Expression of Spatial Correlation by a Random Curved Surface Model and Its Application to LSI Design
Shin-ichi OHKAWA Hiroo MASUDA Yasuaki INOUE 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2008/04/01
Vol. E91-A  No. 4 ; pp. 1062-1070
Type of Manuscript:  Special Section PAPER (Special Section on Selected Papers from the 20th Workshop on Circuits and Systems in Karuizawa)
LSI designdevice variationrandom curved surfaceGaussiansystematic part
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