Keyword : device parameter variation

Analytical Estimation of Path-Delay Variation for Multi-Threshold CMOS Circuits
Shiho HAGIWARA Takashi SATO Kazuya MASU 
Publication:   IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 2009/04/01
Vol. E92-A  No. 4 ; pp. 1031-1038
Type of Manuscript:  Special Section PAPER (Special Section on Advanced Technologies Emerging Mainly from the 21st Workshop on Circuits and Systems in Karuizawa)
device parameter variationMTCMOStiming analysisMonte-Carlo simulation
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