Keyword : deterministic test


A Low Power Deterministic Test Using Scan Chain Disable Technique
Zhiqiang YOU Tsuyoshi IWAGAKI Michiko INOUE Hideo FUJIWARA 
Publication:   IEICE TRANSACTIONS on Information and Systems
Publication Date: 2006/06/01
Vol. E89-D  No. 6 ; pp. 1931-1939
Type of Manuscript:  PAPER
Category: Dependable Computing
Keyword: 
low power testingfull scan testingdeterministic testscan chain disabletabu search algorithm
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