Publication: IEICE TRANSACTIONS on Fundamentals of Electronics, Communications and Computer Sciences
Publication Date: 1993/10/25
Vol. E76-A
No. 10 ;
pp. 1730-1737
Type of Manuscript:
Special Section PAPER (Special Section on VLSI Design and CAD Algorithms)
Category:
Keyword:
distinguishing sequence, stuck-at fault, sequential circuit, test sequence generation, design rechnique, |
