Keyword : degradation


Panel Structural Factors and Luminance Degradation of PDP Phosphors
Teruo KURAI 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/07/01
Vol. E85-C  No. 7 ; pp. 1506-1515
Type of Manuscript:  PAPER
Category: Electronic Displays
Keyword: 
PDPphosphorsdegradationion-bombardment
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Polarization Fatigue Modeling of Ferroelectric Capacitors
Kiyoshi NISHIMURA 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 2002/06/01
Vol. E85-C  No. 6 ; pp. 1334-1341
Type of Manuscript:  PAPER
Category: Microwaves, Millimeter-Waves
Keyword: 
ferroelectricfatiguedegradationmodelNVRAM
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Reliability of Low-Noise HEMTs under Gamma-Ray Irradiation
Yasunobu SAITO Fumio SASAKI Hisao KAWASAKI Hiroshi ISHIMURA Hirokuni TOKUDA Motoharu OHTOMO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/09/25
Vol. E76-C  No. 9 ; pp. 1379-1383
Type of Manuscript:  Special Section PAPER (Special Issue on Heterostructure Electron Devices)
Category: 
Keyword: 
reliabilityHEMTγ-raydegradation
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Optoelectronic Integrated Circuits Grown on Si Substrates
Takashi EGAWA Takashi JIMBO Masayoshi UMENO 
Publication:   IEICE TRANSACTIONS on Electronics
Publication Date: 1993/01/25
Vol. E76-C  No. 1 ; pp. 106-111
Type of Manuscript:  INVITED PAPER (Special Issue on Opto-Electronics and LSI)
Category: Integration of Opto-Electronics and LSI Technologies
Keyword: 
GaAs/SiOEIClaserdegradationMOCVD
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