Publication: IEICE TRANSACTIONS on Information and Systems
Publication Date: 2008/03/01
Vol. E91-D
No. 3 ;
pp. 683-689
Type of Manuscript:
Special Section PAPER (Special Section on Test and Verification of VLSIs)
Category: Defect-Based Testing
Keyword:
defect based testing, test vector generation, test vector modification, bridging faults, fault extraction, |
